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Facilities
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Growth & In Situ Characterization |
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Growth and In Situ Characterization
OU MBE Facility: Four Chamber Intevac Gen II MBE
system
- Growth
- III-V growth chamber
- Group IIIs: In, Ga, Al, and Group IVs: Sb and As. Dopants Si and
Be
- IV-VI and fluorides growth chamber
- Group IV: Pb and Group VIs: Se and Te. Fluorides: CaF2 and BaF2
, Rare earth dopants Eu, Tm and Mn
- Surface analysis chamber for Auger Electron Spectroscopy (AES) and
X-ray Photoelectron Spectroscopy (XPS) with sputtering
- Omicron scanning probe microscopy chamber (STM and AFM)
- Research
Growth of InSb/AlxIn1-xSb quantum wells
- Low-temperature two-dimensional transport with a low-effective
mass, a high g-factor, and a non-parabolic dispersion relation
- Potentially lead to improved magnetoresistive sensors and faster
transistors
UA MBE Facility
- Growth
- Riber solid source MBE 32P III-V compound semiconductor growth
chamber.
- Sources include Ga, In, Al, As, and P with Be and Si available
dopants. Includes RHEED system with digital pattern analysis,
non-contact substrate temperature measurement, RGA.
- Riber solid-source MBE 32P compound semiconductor growth chamber.
- Sources include Ga, In, Al, and As, with Si available dopant.
Includes RHEED system with digital video pattern analysis, non-contact
substrate temperature measurement, RGA.
- Vecco Gen II gallium nitride MBE growth system.
- Sources include Ga, In, Al, N (RF plasma source), with Si and
Mg available dopants.
- Riber solid-source MBE 32P ferroelectric growth chamber. (scheduled
winter 2004-2005)
- In-vacuo characterization (all also have ex-situ loading capabilities)
- Omicron RT-STM/AFM (room temperature scannin tunneling microscope/atomic
force microscope)
- Omicron VT-STM (variable temperature STM)
- Omicron STM/SEM/SAM (has integral SEM to be used as spotting scope
for STM, also scanning Auger for elemental identification).
UA Colloidal Lab
- GBC 932-Plus Atomic Absorbtion Spectrometer. Lamps: 21 metals and metaloids.
- UV-Vis: HP 8453 UV-Visible Spectrometer, photodiode detector, 190-1100
nm detection range
- Spex Fluorolog 3-111 Spectrofluorometer, 450-W Xe lamp source. 240-1600
nm detection range.
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